The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 1996
Filed:
Jul. 11, 1994
Applicant:
Inventors:
Koichi Maruyama, Tokyo, JP;
Syun'itirou Wakamiya, Tokyo, JP;
Makoto Iwaki, Tokyo, JP;
Masahiro Oono, Tokyo, JP;
Assignee:
Asahi Kogaku Kogyo Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G01B / ;
U.S. Cl.
CPC ...
359642 ; 359756 ; 359761 ; 359754 ; 356124 ; 356359 ;
Abstract
An objective lens is corrected for spherical aberration at both an operating wavelength and a measurement wavelength, such that the amount of spherical aberration to develop at the operating wavelength is substantially equal to the amount of spherical aberration to develop at a measuring wavelength. The method of lens performance measurement then uses a light source emitting at a wavelength different from the operating wavelength.
Maruyama, Koichi. (1996). Objective lens and method of measuring its performance (U.S. Patent No. 5500767). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5500767
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile