The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 1996
Filed:
Jun. 10, 1994
James Ebel, Jacksonville, FL (US);
Mary L Dolan, Jacksonville, FL (US);
Russell J Edwards, Jacksonville, FL (US);
Peter W Sites, Knoxville, TN (US);
Johnson & Johnson Vision Products, Inc., Jacksonville, FL (US);
Abstract
A system and method for inspecting ophthalmic lenses. The system comprises a transport subsystem for moving the lenses into an inspection position, and an illumination subsystem to generate a light beam and to direct the light beam through the lenses. The system further comprises an imaging subsystem to generate a set of signals representing selected portions of the light beam transmitted through the lenses, and a processing subsystem to process those signals according to a predetermined program. The illumination subsystem includes a light source to generate a light beam and a diffuser to form that light beam with a generally uniform intensity across the transverse cross section of the light beam. The illumination subsystem further includes a lens assembly to focus a portion of the light beam onto an image plane, and to focus a portion of the light beam onto a focal point in front of the image plane to form a diffuser background pattern on the image plane.