The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 1996
Filed:
Aug. 17, 1994
Robert J Obremski, Yorba Linda, CA (US);
John W Silzel, Orange, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
A method and apparatus determines the analyte content of a sample by generating first and second input signals and directing the input signals to the sample. The input signals differ in wavelength by at least 3 nanometers. Due to the interaction between the input signals and the sample, first and second output signals are generated. Each output signal comprises a resonant signal whose peak wavelength is substantially independent of the wavelength of the respective input signal, and a non-resonant output signal whose peak wavelength is dependent upon the wavelength of respective input signal. A detector is used to detect the two output signals, and by distinguishing the resonant output signals from the non-resonant output signals, data about the analyte content of the sample is determined. Principal components regression analysis or multivariate quantitative analysis can be applied to the output signals, for the purpose of distinguishing between the resonant and non-resonant signals. The method and apparatus can also distinguish resonant output signals from each other, and non-resonant output signals from each other.