The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 1996
Filed:
Sep. 07, 1993
Applicant:
Inventor:
Edward R Dykes, San Jose, CA (US);
Assignee:
General Electric Company, San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73634 ; 73621 ; 73598 ;
Abstract
A method and an apparatus for measuring and then controlling the refracted angle of ultrasonic waves propagating through a component. The method directly measures the actual refracted angle of ultrasound in an industrial component while performing nondestructive examination by measuring the slopes of characteristic echo-dynamic lines. These slopes are related to the angle of refraction by a simple mathematical relationship. A pattern recognition filtering method is used to identify the echo-dynamic pattern. The slope of an echo-dynamic line is computed after an edge detection algorithm is applied to the data.