The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 1996

Filed:

Oct. 14, 1994
Applicant:
Inventor:

Harald Kayser, Hamburg, DE;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
378196 ; 378197 ;
Abstract

An X-ray examination apparatus, including a patient table which is pivotable about a first axis, a spot film device which is arranged over the table top of the patient table and which is displaceable parallel to the table top by means of a transport device, and also an X-ray source which is coupled to the transport device in order to form an X-ray beam. The use of the X-ray source, either underneath the table top for use with the spot film device, or over the table top for overtable X-ray exposures, positioning is possible in that the X-ray source is pivotable about a second axis which is connected to the transport device and which extends parallel to the first axis.


Find Patent Forward Citations

Kayser, Harald. (1996). X-ray examination apparatus (U.S. Patent No. 5497408). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5497408

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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