The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 1996

Filed:

Jun. 14, 1993
Applicant:
Inventors:

Shinichi Uramoto, Hyogo, JP;

Hideyuki Terane, Hyogo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364745 ; 36471508 ;
Abstract

A data comparator detects the coincidence or non-coincidence of the logical states between two adjacent bits of the plural bit input data and applies the comparison result signal to a non-coincident bit detection circuit. A mask generator decodes a shift select signal indicating the amount of shift to produce mask data and applies the produced mask data to a non-coincident bit detection circuit. The non-coincident bit detection circuit masks the output of the data comparator on the basis of the mask data and decides whether or not an overflow is produced from the masked output of the data comparator to output the result of decision.


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Uramoto, Shinichi. (1996). Apparatus and method for detecting an overflow when shifting n bits of (U.S. Patent No. 5497340). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5497340

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