The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 1996
Filed:
Jan. 12, 1995
Cecil R Bell, Pinnacle, NC (US);
Monarch Knitting Machinery Corporation, Flushing, NY (US);
Abstract
A hosiery inspecting and grading apparatus and a method of inspecting hosiery are provided that preferably has a boarding member arranged to mount a completed hosiery article thereon. The boarding member preferably is formed of a translucent material. An optical inspecting system is positioned adjacent the boarding form and is arranged to inspect a completed hosiery article mounted on the boarding member. The optical inspecting system preferably includes at least one light emitter positionally aligned with the boarding member to emit light through a predetermined portion of a completed hosiery article mounted thereon and at least one light detector positionally aligned with the at least one light emitter and the boarding member to detect the presence and absence of light traveling from the light emitter and through the predetermined portion of a completed hosiery article mounted on the boarding member so that presence and absence of defects in a completed hosiery article are thereby determined. The apparatus also has a grading and sorting system positioned downstream from the boarding member and the optical inspecting system and in electrical communication with the optical inspecting system to grade and sort a completed hosiery article responsive to electrical signals representative of presence or absence of defects received from the optical inspecting system.