The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 1996

Filed:

Dec. 19, 1994
Applicant:
Inventors:

Hong Tian, Milpitas, CA (US);

Jia-Kuen J Lee, San Jose, CA (US);

Ellis T Cha, Santa Clara, CA (US);

Assignee:

Conner Peripherals, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
324212 ; 360137 ;
Abstract

A method is shown for testing a magnetic disk to be used in a disk drive. The method includes the steps of measuring a height profile of an outer radial edge of the disk, using the profile to determine a slope value for each of a pair of radial segments of the disk, calculating a difference value between the slope values of the pair, comparing the difference value to a preselected threshold difference value and indicating when the difference value is equal to or less than the threshold difference value. The threshold value indicates an outer most diameter of the disk where fly height operation for a head is still stable.


Find Patent Forward Citations

Tian, Hong. (1996). Method for determining an outer diameter rolloff in a process for making (U.S. Patent No. 5497085). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5497085

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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