The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 1996
Filed:
Jul. 01, 1994
Applicant:
Inventor:
Thorald Bergmann, 82441 Ohlstadt, DE;
Assignee:
Other;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250287 ; 250284 ;
Abstract
A high particle density in the extraction volume of a gasphase ion source and simultaneously a very low particle density in the driftspace of the time-of-flight mass-spectrometer are necessary for high sensitivity and a large dynamic range of the mass-spectrometer signal output. This can be achieved by separating the time-of-flight mass-spectrometer into two or more regions of different pressure, connecting the different regions by gas flow restrictions. A maximum particle density in the extraction volume and simultaneously a minimal particle density in drift space can be achieved by integrating the gas flow restrictions(3,6) directly into the electrodes(1,2) of the ion source.