The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 1996

Filed:

Jan. 20, 1995
Applicant:
Inventor:

Michael E McAleavey, San Jose, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05C / ;
U.S. Cl.
CPC ...
118677 ; 118679 ; 118712 ; 356381 ; 427 10 ;
Abstract

In a system for monitoring and controlling the thickness of a laminate, an apparatus is provided to apply material for forming a material layer onto a web so that a laminate is formed. The tip of a knife and the surface of the web upon which the material is applied define a space, and the knife is movable relative to the web to vary the size of the space. The web coated with the material layer is drawn past the knife to form a desired thickness material layer. A measuring apparatus measures whether the thickness of the material layer plus the thickness of the web is equal to a predetermined value. The tip of the knife is moved relative to the web to adjust the thickness of the material layer in response to a signal from the measuring apparatus. A method of monitoring and controlling the thickness of a laminate is also described.


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