The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 1996
Filed:
Jun. 10, 1993
Applicant:
Inventors:
George W Rhodes, Albuquerque, NM (US);
Albert Migliori, Sante Fe, NM (US);
Raymond D Dixon, White Rock, NM (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01H / ;
U.S. Cl.
CPC ...
73579 ; 73602 ;
Abstract
A method of measurement of objects to determine object flaws, Poisson's ratio (.sigma.) and shear modulus (.mu.) is shown and described. First, the frequency for expected degenerate responses is determined for one or more input frequencies and then splitting of degenerate resonant modes are observed to identify the presence of flaws in the object. Poisson's ratio and the shear modulus can be determined by identification of resonances dependent only on the shear modulus, and then using that shear modulus to find Poisson's ratio using other modes dependent on both the shear modulus and Poisson's ratio.