The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 1996

Filed:

Dec. 23, 1993
Applicant:
Inventors:

Larry L Byers, Apple Valley, MN (US);

Joseba M De Subijana, Minneapolis, MN (US);

Wayne A Michaelson, Circle Pines, MN (US);

Assignee:

Unisys Corporation, Blue Bell, PA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; H03M / ;
U.S. Cl.
CPC ...
371 201 ; 371 55 ; 371 572 ;
Abstract

A method and apparatus for detecting stuck faults in a signal line used to communicate a branch condition for executing conditional branch instructions by a data processing system containing a programmable microprocessor and multiple VLSI gate arrays connected by a bi-directional bus, whereby the branch condition is obtained from a storage location resident on a VLSI gate array executing asynchronous and external to the microprocessor. The branch condition is fetched and evaluated in parallel with the fetching of the branch target address and the incrementing of the program counter. The microprocessor changes instruction sequence control depending on the results of the branch condition evaluation. The branch condition is sent to the microprocessor as a signal pulse for a specified duration at a particular time, rather than by changing the level of the signal, thereby allowing communication of the branch condition over only one signal line but still providing for detection of faults in the VSLI gate array or faults inherent in the signal line.


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