The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 1996
Filed:
Sep. 30, 1992
Timothy D Corrie, Jr, Redmond, WA (US);
Robert F Day, Bothell, WA (US);
Kenneth S Gregg, Redmond, WA (US);
John L Miller, Bellevue, WA (US);
Sivaramakichenane Somasegar, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
The present invention provides a method and system for performing parametric testing of a functional programming interface. Parametric testing of a function verifies that the function performs as expected when a valid or an invalid parameter is passed to the function. To perform parameter testing on a function, the present invention receives as input prototype information for the function, and then formulates a testing plan. The invention tests the function according to the testing plan. The testing plan specifies a list of invalid and valid values for each parameter of the function. The invention repeatedly invokes the function, each time passing the function various combinations of invalid and valid values. The function passes the test when (1) the function does not return an error code for any combination of valid parameter values and (2) the function returns an error for any combination of parameter values that include an invalid parameter value.