The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 1996
Filed:
Oct. 12, 1994
Robert T Frankot, Van Nuys, CA (US);
Ralph E Hudson, Los Angeles, CA (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
A method for automatically selecting subareas from reference image data such that registration accuracy is optimized between images. Optimal subarea selection reduces the on-line computation and reference data storage required for multi-subarea correlation or, alteratively, improves its effectiveness. Example results for a synthetic aperture radar (SAR) image are described. The results indicate that the automatic subarea selection method of the present invention reduces on-line computation by a factor of 2 to 3 (relative to random subarea selection) without degradation in accuracy. The present selection method minimizes the predicted total mean squared registration error (MSE). The total MSE is predicted in terms of the position and predicted measurement covariance (derived from local image statistics) of each candidate subarea. Combinatorial optimization procedures select a predetermined number of subareas to minimize total MSE. The present method jointly considers the quality and position for each local measurement, optimally handles any order polynomial model, and includes bounds on the uncertainty of registration parameters.