The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 1996
Filed:
Dec. 11, 1992
Fumio Matsunari, Nagoya, JP;
Kazutaka Ogo, Nagoya, JP;
Tadayuki Abe, Okazaki, JP;
Masayuki Asai, Toyoake, JP;
Kabushiki Kaisha Toyota Chuo Kenkyusho, Aichi, JP;
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Abstract
A process time estimating apparatus is disclosed for estimating the process time for manufacturing an object such as a metal die. The apparatus includes a process time estimating section, a process occupancy time measurement section and a process program scheduling section. The process time estimating section includes a neural network device as an estimating device. An estimation input factor extracting section extracts input factors such as drawing information for an object to be manufactured. A storing section stores input factors for later neural network learning to improve the estimation capability of the system. The process occupancy time measurement section reads the process code and automatically measures the actual time involved in performing the process for a particular object being manufactured. A selecting section selects a measured process time for neural network learning. The process program scheduling section receives output information from the time measurement section and stores time estimates which are compared with actual process times for selecting a measured process time for further neural network learning.