The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 1996
Filed:
Dec. 15, 1993
Jurgen Gast, Rheinstetten, DE;
Bruker Analytische Messtechnik GmbH, Rheinstetten, DE;
Abstract
In an infrared (IR) microscope for a Fourier transform (FT) infrared spectrometer with a Cassegrain mirror-lens with which an incident beam (15) can be focused via a convex mirror (16) and a concave mirror (17) onto a first point-shaped region (19) on the surface of a sample (20) under an angle of incidence .beta.<60.degree. relative to the optical axis (22) and subsequent to travelling through an optical path x, a first planar mirror (1) and a second planar mirror (2) are arranged between the concave mirror (17) and the surface of the sample (20) such that the luminous beam (30) reflected from the concave mirror (17) in the direction of the sample (20) is focused onto the first planar mirror (1), onto the second planar mirror (2), then onto a second point-shaped region (19') on the surface of the sample (20), the second point-shaped region lying on the optical axis (22) closer to the lens (16, 17) than the first point-shaped region (19), whereby the sum of the optical paths is equal to the optical path x, whereby the angle of incidence .beta.' is larger than 60.degree. and whereby a third planar mirror (3) and a fourth planar mirror (4) are arranged symmetrically with respect to the second (2) and first (1) planar mirrors.