The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 1996

Filed:

Jan. 25, 1994
Applicant:
Inventors:

Akio Konda, Tokyo, JP;

Hiroyuki Konaka, Tokyo, JP;

Makoto Yamashita, Tokyo, JP;

Norio Yasuoka, Hyogo, JP;

Shigeru Kato, Hyogo, JP;

Toshio Kometani, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356339 ; 356343 ; 250574 ;
Abstract

There is provided a method and apparatus of detecting minute impurities in the entire body of a fluid. Part of the passage through which the fluid flows is constituted by a transparent member. Light is emitted in a direction substantially parallel to the longitudinal axis of this part of the fluid passage so as to envelop the same. Light scattered by impurities in the fluid is observed from a direction substantially perpendicular to the direction of the passage to detect any minute impurities in the fluid. The method and apparatus is well-suited for use in systems which extrude molten resin in the formation of plastic products used in an electrical environment in order to detect impurities in the resin which could adversely affect the performance of the products.


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