The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 1996

Filed:

Nov. 30, 1993
Applicant:
Inventors:

Stuart T Spence, South Pasadena, CA (US);

Thomas A Almquist, San Gabriel, CA (US);

Harry L Tarnoff, Van Nuys, CA (US);

Warren Juran, Sylmar, CA (US);

Assignee:

3D Systems, Inc., Valencia, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ; B28B / ;
U.S. Cl.
CPC ...
356121 ; 4251744 ;
Abstract

An apparatus and a method for calibrating and normalizing a stereolithographic apparatus so that a reaction means directed by a positioning means supplied with positioning means information may be positioned accurately on a designated surface of a working medium. One or more sensors fixed in location with respect to the designated surface of the working medium are utilized to correlate positioning means information with specific locations on the designated surface of the working medium. Other locations intermediate the specific locations may then be determined by the technique of linear interpolation.


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