The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 1996
Filed:
Jul. 14, 1993
Applicant:
Inventors:
Koichi Futsuhara, Urawa, JP;
Masakazu Kato, Urawa, JP;
Assignee:
The Nippon Signal Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B / ;
U.S. Cl.
CPC ...
340507 ; 340518 ; 364138 ; 364140 ;
Abstract
A fail-safe scan circuit sequentially and periodically drives and scans objective devices. The scan circuit has a failure detector that provides, upon detecting a failure, a signal of logical value 0 to inform of the failure. Adjacent input signals to the failure detector have a phase difference of .pi.. This phase difference results in simplifying the structure of the failure detector. The fail-safe scan circuit is employable to drive and scan many photosensors of a fail-safe multibeam sensor.
Quick Actions:
Futsuhara, Koichi. (1996). Fail-safe scan circuit and a multibeam sensor (U.S. Patent No. 5495228). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5495228
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile