The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 1996
Filed:
Dec. 08, 1992
Applicant:
Inventors:
Buzz A Wincheski, Williamsburg, VA (US);
Joseph S Heyman, Williamsburg, VA (US);
Min Namkung, Yorktown, VA (US);
James P Fulton, Hampton, VA (US);
Assignee:
Administrator, National Aeronautics and Space Administration, Washington, DC (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01H / ;
U.S. Cl.
CPC ...
364508 ; 364506 ; 364507 ; 73577 ; 73799 ; 73801 ; 73668 ;
Abstract
A device and method are provided which non-destructively detect crack length and crack geometry in thin metallic plates. A non-contacting vibration apparatus produces resonant vibrations without introducing extraneous noise. Resulting resonant vibration shifts in cracked plates are correlated to known crack length in plates with similar resonant vibration shifts. In addition, acoustic emissions of cracks at resonance frequencies are correlated to acoustic emissions from known crack geometries.