The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 1996
Filed:
Sep. 29, 1994
Jar J Lee, Irvine, CA (US);
Stan W Livingston, Fullerton, CA (US);
Irwin L Newberg, Northridge, CA (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
A calibration and diagnostic system and method for evaluating the performance of a wide band array utilizing a true-time-delay beamforming network. A short pulse typically on the order of a 2 nanoseconds is synthesized by transmission of a large number of discrete, equally spaced frequencies over the bandwidth over a short period of time, during which the system response (amplitude and phase) is measured and stored in a computer. The collected data is then transformed into the time domain to demonstrate the range resolution of the system. By signal injection with a built-in calibration system, the setting of each programmable delay line of the array can be calibrated. A fiber-optic test set is used as a transponder in the far field to perform complete end-to-end tests of the array system.