The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 1996
Filed:
Nov. 30, 1992
Applicant:
Inventor:
Brian J Fitzpatrick, Ossining, NY (US);
Assignee:
Optical Semiconductors, Inc., Peekskill, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
250369 ; 2503 / ; 250366 ;
Abstract
A method and apparatus for measuring radiation are disclosed in which a scintillation body intercepts incident radiation to cause the body to emit a population of scintillation photons, the population of scintillation photons is spectrally decomposed into at least a first subpopulation of photons and a second subpopulation of photons (the first subpopulation originating from faster time decay processes than the second subpopulation) and at least one of the subpopulations is detected.
Fitzpatrick, Brian. (1996). Method and apparatus for measuring incident radiation (U.S. Patent No. 5493121). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5493121
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile