The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 1996
Filed:
Sep. 07, 1993
Leslie W Pickering, Atlanta, GA (US);
Eric N Barnhart, Lawrenceville, GA (US);
Bruce A Harvey, Norcross, GA (US);
Michael L Witten, Decatur, GA (US);
Georgia Tech Research Corporation, Atlanta, GA (US);
Abstract
A cell engineering tool (10) evaluates wireless communications channels within and around architectural structures, such as buildings, in order to determine communications transfer characteristics, including the RMS signal power level and the complex-valued frequency-domain transfer function H(f) of the communications channel. In architecture, the CET (10) comprises a user interface (12) and an analysis engine (14) communicating with the user interface (12). The analysis engine (14) has a plurality of propagation models (16), which may be run concurrently for validation, if desired. Using the user interface (12), which is preferably a graphics mechanism, the user (18) inputs a floor plan, wall material parameters (conductivity, permittivity), and the location of a transmitter (53) and receiver (54) within the floor plan. The analysis engine (14) analyzes the input parameters and uses one or more of the propagation models (16) in order to derive a CET output. The propagation models (16) include an analytical model (26), a ray tracing model (27), and a statistical model (28). The analytical model (26) and the ray tracing model (27) are utilized to derive the transfer function H(f) and their respective results can be compared with each other for validation. Further, the statistical model (28) may be used to generate a rapid approximation of the RMS signal power loss or level.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile