The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 1996
Filed:
Mar. 29, 1994
Alexander Knuttel, Rockville, MD (US);
Bruker Medizintechnik, Rheinstetten, DE;
Abstract
In an optical imaging apparatus for the investigation of strongly scattering media, in particular biological tissue samples, with at least one-dimensional position resolution in a depth direction of a measuring object, with a radiation source for radiating low coherence light, with a device for splitting the low coherence light into two partial beams, of which one is guided in an object arm to the measured object and the other in a reference arm to a reflecting element, and with a detector configuration to which the partial beams reflected from the reflecting element in the reference arm and from the measured object in the object arm can be guided, brought into interference with another, and detected, the detector configuration exhibits a spatial extent transverse to the incident direction of both partial beams on the detector configuration along which light signals can be recorded in a position sensitive and simultaneous fashion and both partial beams in the object arm and in the reference arm are so guided that a spatial interference pattern occurs along the lateral extent of the detector configuration, whereby the reflecting element in the reference arm exhibits only static parts which, in any event, are non-mechanically moving. In this fashion a simple and economical as well as especially mechanically stable reflectometer apparatus is achieved with which a rapid sequence of image recordings is possible.