The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 1996

Filed:

Mar. 01, 1994
Applicant:
Inventors:

Andrew Kogan, Palo Alto, CA (US);

Alexander Taratorin, Palo Alto, CA (US);

Alexander Tesler, Palo Alto, CA (US);

Dmitry Varsanofiev, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
364554 ; 371-51 ; 360 53 ;
Abstract

A method and apparatus for measuring the error rate of a magnetic recording device, such as a hard disk storing a set of data. The apparatus has a partial response maximum likelihood data detecting channel (PRML channel) which differs from a conventional PRML channel by including a noise processing unit (66) which is connected between the output of an A/D converter (54) and the input of a sequence detector (60), and a histogrammer (70), which is connected to the output of a noise processing unit. The method consists of estimating a sequence of noise samples received from the output of the A/D converter (54), processing the sequence of noise samples according to a plurality of predetermined sets of processing coefficients, accumulating a plurality of histograms of segregated processed noise samples, and processing the plurality of histograms so as to determine a dependence of a number of errors on a preselected criterion which characterizes a signal-to-noise ratio of the PRML channel. The above dependence can be extrapolated for an actual error rate of the channel being tested.


Find Patent Forward Citations

Kogan, Andrew. (1996). Histograms of processed noise samples for measuring error rate of a prml (U.S. Patent No. 5490091). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5490091

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