The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 1996

Filed:

Oct. 11, 1994
Applicant:
Inventors:

Paul C Sheldon, Mequon, WI (US);

Edward E Kirkham, Brookfield, WI (US);

Lyle D Ostby, West Allis, WI (US);

Bruce P Konkel, Muskego, WI (US);

Assignee:

Giddings & Lewis, Fond du Lac, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23C / ; B25J / ;
U.S. Cl.
CPC ...
409235 ; 248631 ; 248654 ; 408234 ; 409145 ; 409216 ; 901 22 ; 901 23 ;
Abstract

The present invention relates generally to a metrology framework for determining the position of a first object, such as an operator, relative to a second object when the first object is moved relative to the second object. The metrology framework comprises a plurality of extensible instrument arms that are operatively connected in proximity to the first object and the second object. A sensor is in communication with each extensible instrument arm to provide a signal indicative of the extension of the instrument arm. The combination of the signals can be used to determine the position of the first object relative to the second object in all six degrees of freedom.


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