The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 1996

Filed:

Jul. 06, 1994
Applicant:
Inventors:

Ronald Campbell, Mendon, UT (US);

Gaylon Campbell, Pullman, WA (US);

Craig Christensen, Logan, UT (US);

Assignee:

HarvestMaster, Inc., Logan, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01F / ;
U.S. Cl.
CPC ...
460-7 ; 56 1 / ; 73 73 ;
Abstract

A grain measuring and weighing device including an entrance chamber, a constant volume chamber, and a weigh chamber. A plurality of gates controllably move between open and closed positions to allow a known volume of grain to flow between chambers. The weighing and measuring system includes a means for compensating and eliminating forces external to the grain harvester, such as the various forces due to sloping surfaces and rough terrain over which the grain harvester moves, that would otherwise adversely affect the grain yield data. In one embodiment, an accelerometer is use to measure such external forces. In another embodiment, a reference weight is used to measure the external forces.


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