The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 1996

Filed:

Feb. 16, 1995
Applicant:
Inventor:

Shinya Nagashima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356346 ; 356358 ; 356356 ; 2502 / ;
Abstract

The purpose of the present invention is to provide a highly accurate optical wavelength meter in which the accurate starting and stop points of the measurement are detected. In accordance with the present invention, a detector which detects the back-shift of the moving mirror due to elastic force of the belt and an up-down counter which measures the amounts of the overshoot and the back-shift of the moving mirror so as to cancel the overshoot and the back-shift are provided, by which the accurate starting and stop points of the measurement can be detected.


Find Patent Forward Citations

Nagashima, Shinya. (1996). Optical wavelength meter with an up-down counter which measures the (U.S. Patent No. 5486918). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5486918

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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