The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 1996
Filed:
Oct. 19, 1994
Leo B Baldwin, Horseheads, NY (US);
Emhart Glass Machinery Investments Inc., Wilmington, DE (US);
Abstract
An inspection machine for inspecting a vertically standing container comprising a conveyor for horizontally displacing a vertically standing glass container through spaced inspection locations, a first pair of diffused light sources located behind the conveyor for forwardly directing angularly related beams of light substantially horizontally at a container located at one of the inspection locations, the beams being sufficiently large so that the light beams will pass around the entire profile of a container located at the first inspection location, a first two dimensional camera having an imaging surface on the other side of the conveyor, and first means for redirecting the forwardly directed beams to corresponding halves of the imaging surface, a second pair of diffused light sources located in front of the conveyor for rearwardly directing angularly related beams of light substantially horizontally at a container located at the other one of the inspection locations, the beams being sufficiently large so that the light beams will pass around the entire profile of a container located at the other inspection location, a second two dimensional camera having an imaging surface on the side of the conveyor opposite to the second pair of diffused light sources, second means for redirecting the rearwardly directed light beams to corresponding halves of the imaging surface of the second two dimensional camera, and means for analyzing the sidewall image in each half of each image sensor.