The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 1996

Filed:

Oct. 17, 1994
Applicant:
Inventor:

Manfred Kemmler, Vorstetten, DE;

Assignee:

Litef GmbH, Freiburg im Breisgau, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C / ;
U.S. Cl.
CPC ...
356350 ;
Abstract

An integrated optics chip is employed as a Michelson interferometer for stabilizing the wavelength of a light source in a fiber optic Sagnac interferometer for measuring rotation rate. A statistically-independent second signal component is applied in addition to a resetting digital phase ramp dependent on rotation rate to a phase modulator incorporated in the integrated optics chip (MIOC). The second signal component optimizes the working point of the phase modulator. By employing such statistically-independent variation of the phase modulation, the light wavelength-dependent measuring signal of the Michelson interferometer may be demodulated from the detector read-out signaled used for readjustment of the light-source wavelength via a light-source temperature and/or injection current change. In open loop operation, scale factor variations can be compensated using the light wavelength-dependent measuring signal.


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