The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 1996

Filed:

Jan. 27, 1995
Applicant:
Inventors:

Akihiro Hayashi, Toyokawa, JP;

Kazuhiro Yoshimura, Toyohashi, JP;

Yasuhisa Murakami, Anjo, JP;

Yasumi Hikosaka, Gamagori, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351243 ; 351239 ;
Abstract

An apparatus for visual acuity test of an examinee's eye comprises test chart presenting device for changing and presenting test chart to the examinee's eye, a switch for designating test chart to be presented by the test chart presenting means, a light delivery optical system for delivering luminous flux of test chart from the test chart presenting means to the examinee's eye, the light delivery optical system comprising a concave mirror for making the luminous flux of test chart optically from 4 m ahead of the examinee to infinit and a first reflection mirror for reflecting the luminous flux reflected the concave mirror to the examinee's eye, and reflecting angle adjusting device for adjusting reflection angle of the reflection mirror so as to fit to a height of the examinee's eye, a housing for internally mounting the test chart presenting means and the light delivery optical system, the housing having an aperture to allow the luminous flux of test chart pass therethrough and the aperture being provided with a filter on which reflection reducing coating is coated.


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