The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 1996

Filed:

Jul. 21, 1994
Applicant:
Inventors:

Robert J Mailloux, Wayland, MA (US);

Peter R Franchi, Winchester, MA (US);

Harvey E Tobin, Dracut, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
342165 ;
Abstract

A method to measure the far field antenna pattern of an experimental antenna on a smaller range than conventionally used. The basic innovation of the present invention is that the implementation is moved in straight line, toward or away from the antenna under test (AUT), and the measurements are taken while the AUT is rotated about its phase center in a manner that is synchronized with the radial probe.


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