The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 1996
Filed:
Aug. 13, 1993
Giancarlo Mazzoleni, Horsham, PA (US);
Gordon M Baker, Doylestown, PA (US);
Newage Industries, Willow Grove, PA (US);
Abstract
Centering devices are provided for use with Brinell hardness measuring instruments, particularly electro-optical probes, which include one or more illumination sources in a housing having an aperture at one end which is aligned with an optical axis of the probe to provide the optics a view of the specimen surface opposite the opening. In one embodiment, a spider-like centering structure is provided protruding through the probe end opening. The centering structure directs light from source in the probe directly into an indentation in a specimen surface engaging the centering structure and prevents light from crossing the indentation and reducing edge contrast. A mask further prevents spillage of light from each source onto the specimen surface adjoining the indentation and the source so as to heighten contrast differences between the bright surface of the indentation and the dark surrounding specimen surface. Diametric measurements and hardness determinations can be performed without visual observation of the illuminated indentation by an operator. Specimen hardness can be determined from illumination intensity data generated and gathered during a single illumination of the indentation taking about 1/30th of a second. Another device includes a source developing a beam of visible light, which is directed through the probe end opening with sufficient intensity to permit an operator to locate and at least generally align the probe end with an indentation using the light beam.