The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 1996
Filed:
Jun. 29, 1992
Rajeev Alur, Murray Hill, NJ (US);
Alon Itai, Westfield, NJ (US);
Robert P Kurshan, New York, NY (US);
Mihalis Yannakakis, Summit, NJ (US);
AT&T Corp., Murray Hill, NJ (US);
Abstract
Apparatus for developing and verifying systems. The disclosed apparatus employs a computationally-tractable technique for verifying whether a system made up of a set of processes, each of which has at least one delay constraint associated with it, satisfies a given temporal property. The technique deals with the verification as a language inclusion problem, i.e., it represents both the set of processes and the temporal property as automata and determines whether there is a restriction of the set of processes such that the language of the automaton representing the restricted set of processes is included in the language of the automaton representing the temporal property. The technique is computationally tractable because it deals with the problem iteratively: it tests whether a current restriction of the set of processes is included, and if not, it employs a counter-example for the inclusion to either determine that the delay constraints render satisfaction of the given temporal property or to derive a new restriction of the set of processes. Further included in the disclosure are techniques for checking the timing consistency of the counter-example with respect to a delay constraint and techniques for finding the optimal delay constraint.