The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 1996
Filed:
Aug. 24, 1993
Applicant:
Inventors:
Jeffrey S Beasley, Las Cruces, NM (US);
Hema Ramamurthy, Austin, TX (US);
Jaime Ramirez-Angulo, Las Cruces, NM (US);
Mark R DeYong, Las Cruces, NM (US);
Assignee:
New Mexico State University Technology Transfer Corp., Las Cruces, NM (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324537 ; 324522 ; 324765 ; 371 251 ;
Abstract
A method and apparatus for detecting faults in digital, analog, and hybrid integrated circuits is disclosed. A single test vector employing bias voltage on input used in conjunction with pulsing the power supply rails is used to allow detection of the various faults which may be present. The instantaneous rail current (i.sub.DD) is then employed for analysis of the circuit, preferably by neural network.