The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 1996
Filed:
Sep. 15, 1994
Ram Kannegundla, Rochester, NY (US);
Russell J Taras, W. Henrietta, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A test system is provided for the dynamic testing at the same time of a plurality of packaged charge coupled device (CCD) image sensors in which the plurality of image sensors of the same sensor type can be tested under conditions including selectable signal levels of bias control signals and selected signal levels and pulse durations of clocked control signals appropriate to the type of CCD image sensor of the plurality of sensors under test. The test system provides selectably level-adjusted control signals, selector switch means for generating selectable clock signals having the level-adjusted signal levels, and a clock driver for amplifying the clocked control signals. The amplified control signals are directed to a common input terminal of an isolation network assembly, each of separate output terminals thereof connected to a corresponding input terminal of each one of the CCD image sensors to be tested. The test system is designed such that a sole remaining functioning CCD image sensor of the plurality of sensors can still be dynamically tested while all others of the plurality of CCD image sensors have experienced a catastrophic short-circuit condition at the corresponding clocked-signal input terminal.