The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 1996
Filed:
Jul. 26, 1994
Lisa A Tam, Long Beach, CA (US);
Other;
Abstract
A method and device for measuring the concentration of solids within a liquid medium, or other optical properties of a liquid solution or suspension, by the technology of reflectance. In a preferred embodiment, the reflectivity measuring device of the present invention comprises a measuring head or probe having at least one radiation source and at least one radiation sensor positioned therein. The head or probe is attached to a controller/data readout having a microprocessor control system housed therein. The head or probe is positioned within or adjacent a body of liquid. Thereafter, the radiation source is caused to emit radiation and the radiation sensor is utilized to sense the relative amounts of radiation reflected by the body of liquid and/or solids contained therein. The invention is applicable to any system wherein it is desirable to measure solids content or optical properties of liquids, including biological culture systems wherein it is desirable to measure the density or population of microorganisms cells within a liquid culture medium.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile