The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 1996
Filed:
Aug. 02, 1994
Robert J Valenta, West Chicago, IL (US);
Packard Instrument Company, Downers Grove, IL (US);
Abstract
A scintillation measurement system for measuring optical events produced by scintillators in response to the radioactive decay of a constituent or constituents of a sample to be measured comprises a sample support for positioning a sample in a sample well; a bismuth germanate (BGO) scintillation crystal, such as Bi.sub.4 Ge.sub.3 O.sub.12, located adjacent the sample well; a plurality of photodetectors located outside the bismuth germanate crystal for detecting optical events occurring in the sample well or in the bismuth germanate crystal and converting those optical events into electrical pulses; and a pulse analyzing system for receiving the electrical pulses from the photodetectors and determining whether such pulses represent .alpha., .beta. or .gamma. events. This system can be used with samples containing .alpha., .beta. and .gamma. emitters, or any combination thereof.