The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 1996
Filed:
Jan. 21, 1994
Applicant:
Inventors:
Eric M Frey, Tucson, AZ (US);
Norman E Ragan, Jr, Tucson, AZ (US);
Assignee:
Wyko Corporation, Tucson, AZ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K / ; H01J / ;
U.S. Cl.
CPC ...
25044211 ; 250306 ; 2504911 ;
Abstract
A scanning microscope wherein the probe operates at all times in alignment with the piezoelectric element providing the scanning motion. A sample is slidably connected to the piezoelectric element and the target area on the sample is positioned substantially coaxially with the probe and the scanning element prior to commencement of the scanning operation. A particular embodiment of a sample positioner is provided that eliminates any interference by the positioner with the sample during scanning.