The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 1996
Filed:
Jul. 22, 1994
TSI Sensor Incorporated, Sydney, CA;
Abstract
An apparatus, for non-destructively testing for flaws in materials, having a housing assembly with a rotor and a stator for passing over the testing material, an ultrasonic probe fixed to the stator, and an eddy current probe mounted on the rotor. In operation the rotor rotates the eddy current probe about the ultrasonic probe and an indexing coil on the ultrasonic probe monitors the relative position of the eddy current probe. The rotating eddy current probe generates eddy currents in the testing material such that internal flaws effect the normal feed back to the probe. Changes in this feed back are monitored to determine, in conjunction with the indexing coil, the existence and location of flaws in the testing material. In the preferred embodiment a rotary transformer electromagnetically bonds the rotating eddy current probe to the housing stator. Reflected signals received back by the ultrasonic probe are also monitored to determine the existence of flaws, more readily detected by ultrasonic testing, below the probe.