The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 1996
Filed:
Mar. 17, 1994
Applicant:
Inventors:
Rikizo Nakano, Kawasaki, JP;
Noriyuki Matsui, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 27 ; 371 211 ; 371 214 ; 324705 ; 324 731 ; 365201 ;
Abstract
An IC element testing device includes a test pattern generating unit for generating test patterns, a power supply unit for generating a power supply voltage, a superposed voltage generating unit for generating a superposed voltage, and a superposing unit for superposing the superposed voltage on the power supply voltage and for outputting a superposed power supply voltage to an IC element to which the test patterns generated by the test pattern generating unit are applied.