The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 1996
Filed:
Feb. 14, 1994
Kiyoshi Takimoto, Isehara, JP;
Hisaaki Kawade, Yokohama, JP;
Etsuro Kishi, Sagamihara, JP;
Koji Yano, Zama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
The present invention relates to a scanning probe microscope for observing the surface of a sample therethrough by the use of a probe including a probe, means for causing the sample and the probe to scan relative to each other, means for applying an AC voltage between the sample and the probe, and means for detecting an electric current flowing between the sample and the probe at a predetermined phase point of the AC voltage, the surface of the sample being observed on the basis of the detected electric current. The specification also discloses an information recording-reproducing apparatus using such probe microscope.