The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 1996
Filed:
Aug. 02, 1994
Xiaoming Dou, Kyoto, JP;
Harumi Uenoyama, Kyoto, JP;
Kyoto Daiichi Kagaku Co., Ltd., Kyoto, JP;
Abstract
An apparatus and a method for measuring concentrations of components with light scattering allows measurement of concentrations of components in a measuring object to be accomplished in non-destructive fashion by using light in near-infrared wavelength ranges with good transmissivity and relatively low light quantum energy. The apparatus is composed of a light irradiator (1) for irradiating excited light in a near-infrared wavelength range to a measuring object (16), a photodetector (2) for receiving and spectrally separating Raman scattered light derived from the measuring object (16), and an arithmetic unit (3) for calculating concentration of a component in the measuring object (16) from intensity of the Raman scattered light and outputting a calculation result.