The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 1996
Filed:
Jan. 03, 1994
Madeleine E Rosar, Suffern, NY (US);
Karen I Trovato, Putnam Valley, NY (US);
Leendert Dorst, Amsterdam, NL;
Thomas P Warmerdam, Eindhoven, NL;
Philips Electronics North America Corporation, New York, NY (US);
Abstract
A separate user frame of reference is provided for the operator of an electron beam microscope to use in generating position and tilt commands for a motorized goniometer, rather than requiring that the operator input position and tilt commands to the motorized goniometer in the same frame of reference used by the goniometer to implement position and tilt changes. The electron beam image observed by the operator on a display screen furthermore forms the separate user frame of reference in order to make control of the specimen by the operator intuitive. Since the operator observes the user frame of reference and generates position and orientation commands in the user frame of reference, navigation around the sample is easy to accomplish, even for a novice operator. The image does not inadvertently rotate when other specimen movements are intended and an unintended modification in position along the beam axis does not occur for the imaged portion of the specimen unless the operator inputs such a modification.