The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 1996

Filed:

Nov. 03, 1994
Applicant:
Inventor:

Firooz A Sadjadi, Minneapolis, MN (US);

Assignee:

Loral Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A01F / ;
U.S. Cl.
CPC ...
460-7 ; 460149 ; 56 1 / ;
Abstract

An apparatus and method for on-the-go measuring of the amount and quality of grain being harvested including a first light source for projecting a first light image onto a pile of grain on a conveyor in a harvesting machine to cream a three-dimensional light image on the pile of grain on the conveyor and then converting the light image into coordinates for comparison to reference coordinates to determine the volume of the pile of grain on the conveyor belt; and an apparatus for determination of the amount of moisture in the pile of grain by projecting a second light image of a first wavelength onto the pile of grain, with the wavelength of the light of a frequency responsive to the amount of moisture in the pile of grain, and measuring the amount of reflectance of the light image of the first wavelength; and projecting a third light image of a second wavelength on the pile of grain, with the second wavelength of light in a region where reflectance is not responsive to the amount of moisture in the pile of grain, measuring the amount of reflectance of the light image of the second wavelength comparing the ratio of reflectance of the light image of the first wavelength to the reflectance of the light image of the second wavelength to determine the amount of moisture in the pile of grain and location-measuring equipment for determining an area of standing crop harvested.


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