The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 1995
Filed:
Jun. 06, 1994
Stephen J Sicola, Monument, CO (US);
Wayne H Umland, Colorado Springs, CO (US);
Digital Equipment Corporation, Maynard, MA (US);
Abstract
An improved method for testing a large memory array of a digital computer system during system initialization or reset. First, the memory test method checks the whole memory array for addressing faults, and then a first portion of the memory array for both address line and data failures. While operational firmware is loaded into and begins to execute from the tested first portion, the remaining address locations of the array are tested in a background task. Beginning at the last address of the first portion, sequential portions of memory array are tested and released to the functional code as they have been tested.