The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 1995
Filed:
Feb. 14, 1994
Applicant:
Inventors:
Greg A Degi, Fort Collins, CO (US);
Gerald L Meyer, Loveland, CO (US);
Steven L Webb, Loveland, CO (US);
Assignee:
Hewlett-Packard Company, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348297 ; 348312 ; 348362 ;
Abstract
A system and method for improving the signal to noise ratio of a CCD sensor within an optical scanner varies the exposure time of the CCD sensor. Exposure time is varied by clocking the CCD sensor a number of times equal to the number of pixels in the CCD sensor plus an additional number of clock cycles to create a delay. The additional exposure time maximizes the magnitudes of the charges produced by the CCD sensor. The required delay is computed during a pre-scan calibration step.