The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 1995

Filed:

Mar. 13, 1995
Applicant:
Inventors:

Mitumasa Kubo, Kodaira, JP;

Kiyoshi Shidara, Kawagoe, JP;

Assignee:

Teac Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 32 ; 369 47 ; 369 58 ; 369 4426 ;
Abstract

A sector mark detection apparatus detects a sector mark added to an arbitrary sector of an optical disk when seeking the arbitrary sector, where the optical disk has a predetermined recording format in which a predetermined number of sectors are arranged on the optical disk. The sector mark detection apparatus is provided with a gate signal generating circuit for generating a predetermined number of gate signals at predetermined intervals based on timings between pulse signals which are read from the optical disk, a mark length generating circuit for generating mark length data related to lengths of the sector marks from the read pulse signals based on the timings, a counter circuit for measuring widths of the gate signals by counting at a predetermined frequency and for outputting counted values, a matching circuit for comparing the counted values and match data and for outputting a matched result, and a judging circuit for judging the sector mark of the arbitrary sector based on the mark length data and the matching result.


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