The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 1995

Filed:

Feb. 05, 1993
Applicant:
Inventor:

Anil K Jain, North Oaks, MN (US);

Assignee:

APA Optics, Inc., Blaine, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
359565 ; 359573 ; 359575 ;
Abstract

A method and apparatus for splitting, scanning and receiving a beam of light is disclosed. Binary optic array components are used to split, in an angular manner, an input beam into multiple beams, traveling in different directions. Miniaturized array element BOCs arranged in 'n' different groups are used, wherein n is dependent upon the number of split beams needed or desired. An offset is introduced between the optical axis of each of the corresponding pair of miniaturized BOCs. By varying the offset over time, the resultant beam(s) can be scanned in one, two or three dimensions. Piezo-electric drivers controlled by a processor may be used to move the array in order to vary the offset. The device may also include a collection area to collect the returned scanned beams by using an array of optic components integrated with the scanner. The collected beams are then focused onto detectors.


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