The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 1995

Filed:

Oct. 28, 1994
Applicant:
Inventors:

Kenji Kamimura, Yamanashi, JP;

Shinichi Hanzawa, Yamanashi, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 54 ; 369 58 ; 369 4432 ;
Abstract

An optical pickup for emitting a laser beam is provided for reading data recorded on an optical disc. The axis of the laser beam is tilted at a skew angle from a perpendicular line to the surface of the disc. Error rate in reproduced data read out by the pickup is determined, and an inferior disc having a rare error rate is eliminated.


Find Patent Forward Citations

Kamimura, Kenji. (1995). Method for inspecting an optical disc (U.S. Patent No. 5475667). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5475667

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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